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1

Family Relationships in Shakespeare and the Restoration Comedy of Manners.by Sarup Singh

Review by: James J. Stathis

Journal:

Shakespeare Quarterly

Year:

1986

Language:

english

File:

PDF, 325 KB

english, 1986

2

Ultrafast Measurements and Physical Modeling of NBTI Stress and Recovery in RMG FinFETs Under Diverse DC–AC Experimental Conditions

Parihar, Narendra, Sharma, Uma, Southwick, Richard G., Wang, Miaomiao, Stathis, James H., Mahapatra, Souvik

Journal:

IEEE Transactions on Electron Devices

Year:

2018

Language:

english

File:

PDF, 6.30 MB

english, 2018

3

Superior PBTI Reliability for SOI FinFET Technologies and Its Physical Understanding

Wang, Miaomiao, Muralidhar, Ramachandran, Stathis, James H., Linder, Barry Paul, Jagannathan, Hemanth, Faltermeier, Jonathan

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 501 KB

english, 2013

4

[IEEE 2009 IEEE International Reliability Physics Symposium - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - The effect of interface thickness of high-k/metal gate stacks on NFET dielectric reliability

Linder, Barry P., Cartier, Eduard, Krishnan, Siddarth, Stathis, James H., Kerber, Andreas

Year:

2009

Language:

english

File:

PDF, 250 KB

english, 2009

5

[IEEE 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Hsinchu (2015.6.29-2015.7.2)] 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits - Low-κ and High-κ breakdown statistics with variability: Clustering model versus reconstruction methodology (Invited)

Wu, Ernest, Baozhen Li,, Stathis, James

Year:

2015

Language:

english

File:

PDF, 4.98 MB

english, 2015

6

Impacts of NBTI and PBTI on SRAM static/dynamic noise margins and cell failure probability

Aditya Bansal, Rahul Rao, Jae-Joon Kim, Sufi Zafar, James H. Stathis, Ching-Te Chuang

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 1.76 MB

english, 2009

7

Dielectric breakdown mechanisms in gate oxides

Lombardo, Salvatore, Stathis, James H., Linder, Barry P., Pey, Kin Leong, Palumbo, Felix, Tung, Chih Hang

Journal:

Journal of Applied Physics

Year:

2005

Language:

english

File:

PDF, 2.55 MB

english, 2005

8

Guest Comment: Downsizing physics for the 90s

Stathis, James H.

Journal:

American Journal of Physics

Year:

1994

Language:

english

File:

PDF, 378 KB

english, 1994

9

[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Bias temperature instability in High-κ/metal gate transistors - Gate stack scaling trends

Krishnan, Siddarth, Narayanan, Vijay, Cartier, Eduard, Ioannou, Dimitris, Zhao, Kai, Ando, Takashi, Kwon, Unoh, Linder, Barry, Stathis, James, Chudzik, Michael, Kerber, Andreas, Choi, Kisik

Year:

2012

Language:

english

File:

PDF, 301 KB

english, 2012

10

Book reviews

Jones, W., Brown, James Robert, Mander, W. J., Krajewski, Władysław, Preston, John M., Psillos, Stathis, Hawley, Katherine, Taylor, John

Journal:

International Studies in the Philosophy of Science

Year:

1995

Language:

english

File:

PDF, 2.44 MB

english, 1995

11

[IEEE 2014 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2014.4.28-2014.4.30)] Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test - The resilience wall: Cross-layer solution strategies

Mitra, Subhasish, Bose, Pradip, Cheng, Eric, Cher, Chen-Yong, Cho, Hyungmin, Joshi, Rajiv, Kim, Young Moon, Lefurgy, Charles R., Li, Yanjing, Rodbell, Kenneth P., Skadron, Kevin, Stathis, James, Szafa

Year:

2014

Language:

english

File:

PDF, 25.24 MB

english, 2014

12

Processes of behavior change and weight loss in a theory-based weight loss intervention program: a test of the process model for lifestyle behavior change

Gillison, Fiona, Stathi, Afroditi, Reddy, Prasuna, Perry, Rachel, Taylor, Gordon, Bennett, Paul, Dunbar, James, Greaves, Colin

Journal:

International Journal of Behavioral Nutrition and Physical Activity

Year:

2015

Language:

english

File:

PDF, 696 KB

english, 2015

13

[IEEE 2014 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2014.12.15-2014.12.17)] 2014 IEEE International Electron Devices Meeting - Multiple breakdown phenomena and modeling for non-uniform dielectric systems

Wu, Ernest, Baozhen Li,, Stathis, James H., Achanta, Ravi

Year:

2014

Language:

english

File:

PDF, 577 KB

english, 2014

14

Controversial issues in negative bias temperature instability

Stathis, James H., Mahapatra, Souvik, Grasser, Tibor

Journal:

Microelectronics Reliability

Year:

2018

Language:

english

File:

PDF, 460 KB

english, 2018

15

The aggressive child

Scott, James G, Tunbridge, Michael, Stathis, Stephen

Journal:

Journal of Paediatrics and Child Health

Year:

2018

Language:

english

File:

PDF, 122 KB

english, 2018

16

[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - Elapsed-time statistics of successive breakdown in the presence of variability for dielectric breakdown in BEOL/MOL/FEOL applications

Wu, Ernest Y., Kim, Andrew, Li, Baozhen, Stathis, James H.

Year:

2018

Language:

english

File:

PDF, 1.71 MB

english, 2018

17

The yield of postmortem genetic testing in sudden death cases with structural findings at autopsy

Lahrouchi, Najim, Raju, Hariharan, Lodder, Elisabeth M., Papatheodorou, Stathis, Miles, Chris, Ware, James S., Papadakis, Michael, Tadros, Rafik, Cole, Della, Skinner, Jonathan R., Crawford, Jackie, L

Journal:

European Journal of Human Genetics

Year:

2019

Language:

english

File:

PDF, 794 KB

english, 2019

18

The end of the assembly line: Shifting patterns of automotive burns

Yon, James R., Fredericks, Charles, Mentzer, Caleb, Kubasiak, John C., Poulakidas, Stathis

Journal:

Year:

2020

File:

PDF, 534 KB

2020

19

The discovery and structure–activity relationships of indole-based inhibitors of glutamate carboxypeptidase II

Brian Grella, Jessica Adams, James F. Berry, Greg Delahanty, Dana V. Ferraris, Pavel Majer, Chiyou Ni, Krupa Shukla, Scott A. Shuler, Barbara S. Slusher, Marigo Stathis, Takashi Tsukamoto

Journal:

Bioorganic & Medicinal Chemistry Letters

Year:

2010

Language:

english

File:

PDF, 687 KB

english, 2010

20

Motion tracking of the outer tips of microtubules

Stathis Hadjidemetriou, Derek Toomre, James Duncan

Journal:

Medical Image Analysis

Year:

2008

Language:

english

File:

PDF, 1.55 MB

english, 2008

21

Recovery study of negative bias temperature instability

Miaomiao Wang, Sufi Zafar, James H. Stathis

Journal:

Microelectronic Engineering

Year:

2009

Language:

english

File:

PDF, 379 KB

english, 2009

22

Aspects of defects in silica related to dielectric breakdown of gate oxides in MOSFETs

Peter E Blöchl, James H Stathis

Journal:

Physica B: Condensed Matter

Year:

1999

Language:

english

File:

PDF, 104 KB

english, 1999

23

Vestibular and pulse-related modulation of skin sympathetic nerve activity during sinusoidal galvanic vestibular stimulation in human subjects

Cheree James, Alexandra Stathis, Vaughan G. Macefield

Journal:

Experimental Brain Research

Year:

2010

Language:

english

File:

PDF, 275 KB

english, 2010

24

Optically induced metastable paramagnetic centers in amorphous SiO2

James H. Stathis, M.A. Kastner

Journal:

Journal of Non-Crystalline Solids

Year:

1985

Language:

english

File:

PDF, 169 KB

english, 1985

25

Real-time imaging of cortical areas involved in the generation of increases in skin sympathetic nerve activity when viewing emotionally charged images

Luke A. Henderson, Alexandra Stathis, Cheree James, Rachael Brown, Skye McDonald, Vaughan G. Macefield

Journal:

Year:

2012

Language:

english

File:

PDF, 2.11 MB

english, 2012

26

Gene expression profiling of flaxseed in mouse lung tissues-modulation of toxicologically relevant genes

Floyd Dukes, Stathis Kanterakis, James Lee, Ralph Pietrofesa, Emily S Andersen, Evguenia Arguiri, Sonia Tyagi, Louise Showe, Yassine Amrani, Melpo Christofidou-Solomidou

Journal:

BMC Complementary and Alternative Medicine

Year:

2012

Language:

english

File:

PDF, 988 KB

english, 2012

27

Ultra-thin oxide reliability for ULSI applications

Wu, Ernest Y, Stathis, James H, Han, Liang-Kai

Journal:

Semiconductor Science and Technology

Year:

2000

Language:

english

File:

PDF, 231 KB

english, 2000

28

Three Books on Restoration and Eighteenth-Century Drama

Review by: James J. Stathis

Journal:

Shakespeare Quarterly

Year:

1983

Language:

english

File:

PDF, 338 KB

english, 1983

29

Control and Modification of Nematic Liquid Crystal Pretilt Angles on Polyimides

Lee, Kang-Wook, Lien, Alan, Stathis, James H., Paek, Sang-Hyon

Journal:

Japanese Journal of Applied Physics

Year:

1997

File:

PDF, 1.15 MB

1997

30

Dietary Curcumin Increases Antioxidant Defenses in Lung, Ameliorates Radiation-Induced Pulmonary Fibrosis, and Improves Survival in Mice

Lee, James C., Kinniry, Paul A., Arguiri, Evguenia, Serota, Matthew, Kanterakis, Stathis, Chatterjee, Shampa, Solomides, Charalambos C., Javvadi, Prashanthi, Koumenis, Constantinos, Cengel, Keith A.,

Journal:

Radiation Research

Year:

2010

Language:

english

File:

PDF, 1.92 MB

english, 2010

31

[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Time-dependent clustering model versus combination-based approach for BEOL/MOL and FEOL non-uniform dielectric breakdown: Similarities and disparities

Wu, Ernest Y., Li, Baozhen, Stathis, James H., LaRow, Charles

Year:

2014

Language:

english

File:

PDF, 673 KB

english, 2014

32

[IEEE 2014 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Hsinchu, Taiwan (2014.4.28-2014.4.30)] Proceedings of Technical Program - 2014 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - The resilience wall: Cross-layer solution strategies

Mitra, Subhasish, Bose, Pradip, Cheng, Eric, Cher, Chen-Yong, Cho, Hyungmin, Joshi, Rajiv, Kim, Young Moon, Lefurgy, Charles R., Li, Yanjing, Rodbell, Kenneth P., Skadron, Kevin, Stathis, James, Szafa

Year:

2014

Language:

english

File:

PDF, 1.77 MB

english, 2014

33

[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Min-log approach to modeling dielectric breakdown data

Yashchin, Emmanuel, Baozhen Li,, Stathis, James, Wu, Ernest

Year:

2012

Language:

english

File:

PDF, 378 KB

english, 2012

34

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - HOT-carrier degradation in undoped-body ETSOI FETS and SOI FINFETS

Wang, Miaomiao, Kulkarni, Pranita, Cheng, Kangguo, Khakifirooz, Ali, Basker, V.S, Jagannathan, Hemanth, Yeh, Chun-Chen, Paruchuri, Vamsi, Doris, Bruce, Bu, Huiming, Lin, Chung-Hsun, Stathis, James H.,

Year:

2010

Language:

english

File:

PDF, 306 KB

english, 2010

35

Book Reviews

Newell, James, Giacomo, Susan M. Di, Stoleroff, Alan, Zucchini, Francesco, Kalyvas, Stathis N, Kennedy, Paul, Ramella, Francesco, Maino, Franca, Hart, Laurie Kain, Threlfall, Monica

Journal:

South European Society & Politics

Year:

1997

Language:

english

File:

PDF, 136 KB

english, 1997

36

Copper Contact for 22 nm and Beyond: Device Performance and Reliability Evaluation

Seo, Soon-Cheon, Yang, Chih-Chao, Wang, Miaomiao, Monsieur, Frederic, Adam, Lahir, Johnson, Jeffrey B., Horak, Dave, Fan, Susan, Cheng, Kangguo, Stathis, James, Doris, Bruce

Journal:

IEEE Electron Device Letters

Year:

2010

Language:

english

File:

PDF, 606 KB

english, 2010

37

Hydrogen Electrochemistry and Stress-Induced Leakage Current in Silica

Blöchl, Peter E., Stathis, James H.

Journal:

Physical Review Letters

Year:

1999

Language:

english

File:

PDF, 116 KB

english, 1999

38

Modeling of time-dependent non-uniform dielectric breakdown using a clustering statistical approach

Wu, Ernest Y., Li, Baozhen, Stathis, James H.

Journal:

Applied Physics Letters

Year:

2013

Language:

english

File:

PDF, 1.21 MB

english, 2013

39

Oxygen-deficient centers and excess Si in buried oxide using photoluminescence spectroscopy

Nishikawa, Hiroyuki, Stahlbush, Robert E., Stathis, James H.

Journal:

Physical Review B

Year:

1999

Language:

english

File:

PDF, 139 KB

english, 1999

40

[IEEE 2012 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2012.10.14-2012.10.18)] 2012 IEEE International Integrated Reliability Workshop Final Report - Keynote Address: Device reliability physics: Past, present, and future

Year:

2012

File:

PDF, 117 KB

2012

41

[IEEE 2014 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2014.6.9-2014.6.12)] 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers - Spatial mapping of non-uniform time-to-breakdown and physical evidence of defect clustering

Wu, Ernest Y., Baozhen Li,, Stathis, James H., Linder, Barry, Shaw, Thomas

Year:

2014

Language:

english

File:

PDF, 676 KB

english, 2014

42

Elastic constants of tungsten between 4.2 and 77 K

Stathis, James H., Bolef, D. I.

Journal:

Journal of Applied Physics

Year:

1980

Language:

english

File:

PDF, 485 KB

english, 1980

43

[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Analysis of recoverable and non-recoverable NBTI and PBTI using AC and DC stresses

Monsieur, Frederic, Cartier, Eduard, Stathis, James

Year:

2011

Language:

english

File:

PDF, 610 KB

english, 2011

44

[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Mechanistic understanding of Breakdown and Bias Temperature Instability in High-K Metal devices using inline Fast Ramped Bias Test

Krishnan, Siddarth A., Cartier, Eduard, Stathis, James, Chudzik, Michael, Kerber, Andreas

Year:

2011

Language:

english

File:

PDF, 251 KB

english, 2011

45

[IEEE 2009 IEEE International Reliability Physics Symposium (IRPS) - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Impact of NBTI and PBTI in SRAM bit-cells: Relative sensitivities and guidelines for application-specific target stability/performance

Bansal, Aditya, Rao, Rahul, Kim, Jae-Joon, Zafar, Sufi, Stathis, James H., Ching-Te Chuang,

Year:

2009

Language:

english

File:

PDF, 334 KB

english, 2009

46

Waste the waist: a pilot randomised controlled trial of a primary care based intervention to support lifestyle change in people with high cardiovascular risk

Greaves, Colin, Gillison, Fiona, Stathi, Afroditi, Bennett, Paul, Reddy, Prasuna, Dunbar, James, Perry, Rachel, Messom, Daniel, Chandler, Roger, Francis, Margaret, Davis, Mark, Green, Colin, Evans, Ph

Journal:

International Journal of Behavioral Nutrition and Physical Activity

Year:

2015

Language:

english

File:

PDF, 833 KB

english, 2015

47

Dietary flaxseed prevents radiation-induced oxidative lung damage, inflammation and fibrosis in a mouse model of thoracic radiation injury

Lee, James C, Krochak, Ryan, Blouin, Aaron, Kanterakis, Stathis, Chatterjee, Shampa, Arguiri, Evguenia, Vachani, Anil, Solomides, Charalambos C, Cengel, Keith A, Christofidou-Solomidou, Melpo

Journal:

Cancer Biology & Therapy

Year:

2009

Language:

english

File:

PDF, 1.67 MB

english, 2009

48

[ECS 208th ECS Meeting - Los Angeles, California (October 16-October 21, 2005)] ECS Transactions - Charge Trapping & NBTI in High k Gate Dielectric Stacks

Zafar, Sufi, Callegari, Alessando, Stathis, James

Year:

2006

Language:

english

File:

PDF, 211 KB

english, 2006

49

[IEEE 2014 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2014.12.15-2014.12.17)] 2014 IEEE International Electron Devices Meeting - Reliability challenges for the 10nm node and beyond

Stathis, James H., Wang, M., Southwick, R.G., Wu, E.Y., Linder, B.P, Liniger, E.G., Bonilla, G., Kothari, H.

Year:

2014

Language:

english

File:

PDF, 414 KB

english, 2014

50

Australian national trends in stimulant dispensing: 2002–2009

Hollingworth, Samantha A., Nissen, Lisa M., Stathis, Stephen S., Siskind, Dan J., Varghese, John M. N., Scott, James G.

Journal:

Australian and New Zealand Journal of Psychiatry

Year:

2011

Language:

english

File:

PDF, 280 KB

english, 2011

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